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dc.contributor.authorEdited by Brundle, C. Richard
dc.contributor.authorEvans, Charles A.
dc.contributor.authorWilson, Shaun
dc.date.accessioned2020-03-01T06:11:31Z
dc.date.available2020-03-01T06:11:31Z
dc.date.issued1992
dc.identifier.citationEdited by Brundle, C. Richard; Evans, Charles A. & Wilson, Shaun (1992). Encyclopedia of materials characterization: surfaces, interfaces, thin films. Boston : Butterworth-Heinemann.en_US
dc.identifier.isbn750691689
dc.identifier.urihttp://hdl.handle.net/123456789/1354
dc.description.abstractEncyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.en_US
dc.language.isoenen_US
dc.publisherButterworth-Heinemannen_US
dc.relation.ispartofseriesMaterials Charactarization Series;
dc.subjectSurfaces (Technology)-Testingen_US
dc.subjectMaterials characterizationen_US
dc.titleEncyclopedia of materials characterization: surfaces, interfaces, thin filmsen_US
dc.typeBooken_US


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عرض سجل المادة البسيط