dc.contributor.author | Edited by Brundle, C. Richard | |
dc.contributor.author | Evans, Charles A. | |
dc.contributor.author | Wilson, Shaun | |
dc.date.accessioned | 2020-03-01T06:11:31Z | |
dc.date.available | 2020-03-01T06:11:31Z | |
dc.date.issued | 1992 | |
dc.identifier.citation | Edited by Brundle, C. Richard; Evans, Charles A. & Wilson, Shaun (1992). Encyclopedia of materials characterization: surfaces, interfaces, thin films. Boston : Butterworth-Heinemann. | en_US |
dc.identifier.isbn | 750691689 | |
dc.identifier.uri | http://hdl.handle.net/123456789/1354 | |
dc.description.abstract | Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Butterworth-Heinemann | en_US |
dc.relation.ispartofseries | Materials Charactarization Series; | |
dc.subject | Surfaces (Technology)-Testing | en_US |
dc.subject | Materials characterization | en_US |
dc.title | Encyclopedia of materials characterization: surfaces, interfaces, thin films | en_US |
dc.type | Book | en_US |